Simultaneous in-situ x-ray beam profile and intensity measurements with a minimally invasive pixelated diamond monitor

Abstract Measuring x-ray beam position, profile, and intensity at synchrotron beamlines provides valuable information for all experiments. Sydor’s transparent camera (TXC), based on technology originally developed Brookhaven National Laboratory[1], enables these measurements in-line with experiments live feedback. The TXC has a low profile that fits within standard vacuum flange width is composed of diamond material > 90% transmission 5 keV x-rays, minimizing disruption beamline space the itself. Standard device parameters include 32 x 32, 60 µ m pitch pixels, linearity over 10 7 – 16 photons/s dynamic imaging range, < 40 pA noise floor, total flux measurement mode. Device performance been evaluated using pinhole mask benchtop silver tube during focusing tests XFP NSLS-II characterization FAST CHESS. This work will highlight features this commercial diagnostic, test results, future directions applications technology.